Deterministic phase retrieval employing spherical illumination
PBN-AR
Instytucja
Wydział Mechatroniki (Politechnika Warszawska)
Książka
Tytuł książki
Optical Measurement Systems for Industrial Inspection IX
Data publikacji
2015
ISBN
Wydawca
SPIE
Publikacja
Główny język publikacji
en
Tytuł rozdziału
Deterministic phase retrieval employing spherical illumination
Rok publikacji
2015
Strony (od-do)
1-11
Numer rozdziału
Identyfikator DOI
Liczba arkuszy
0.5
Hasło encyklopedyczne
Słowa kluczowe
en
Transport of intensity equation based solver, Spherical Illumination, Quantitative Phase imaging, Phase Light modulator
Konferencja
Indeksowana w Scopus
nie
Indeksowana w Web of Science Core Collection
tak
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Nazwa konferencji (skrócona)
Nazwa konferencji
Optical Measurement Systems for Industrial Inspection IX
Początek konferencji
2015-06-21
Koniec konferencji
2015-06-21
Lokalizacja konferencji
Munich
Kraj konferencji
DE
Lista innych baz czasopism i abstraktów w których była indeksowana
Streszczenia
Język
en
Treść
Deterministic Phase Retrieval techniques (DPRTs) employ a series of paraxial beam intensities in order to recover the phase of a complex field. These paraxial intensities are usually generated in systems that employ plane-wave illumination. This type of illumination allows a direct processing of the captured intensities with DPRTs for recovering the phase. Furthermore, it has been shown that intensities for DPRTs can be acquired from systems that use spherical illumination as well. However, this type of illumination presents a major setback for DPRTs: the captured intensities change their size for each position of the detector on the propagation axis. In order to apply the DPRTs, reescalation of the captured intensities has to be applied. This condition can increase the error sensitivity of the final phase result if it is not carried out properly. In this work, we introduce a novel system based on a Phase Light Modulator (PLM) for capturing the intensities when employing spherical illumination. The proposed optical system enables us to capture the diffraction pattern of under, in, and over-focus intensities. The employment of the PLM allows capturing the corresponding intensities without displacing the detector. Moreover, with the proposed optical system we can control accurately the magnification of the captured intensities. Thus, the stack of captured intensities can be used in DPRTs, overcoming the problems related with the resizing of the images. In order to prove our claims, the corresponding numerical experiments will be carried out. These simulations will show that the retrieved phases with spherical illumination are accurate and can be compared with those that employ plane wave illumination. We demonstrate that with the employment of the PLM, the proposed optical system has several advantages as: the optical system is compact, the beam size on the detector plane is controlled accurately, and the errors coming from mechanical motion can be suppressed easily. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Inne
System-identifier
WUT79b6c1ae13e34c86beb33e8fb2c0a71e
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