Język
EN
Treść
Multireflection grazing incidence X-ray diffraction (MGIXD) was applied to measure residual stresses in thin surface layers. The influence of X-ray stress factors on the interpretation of MGIDX results for polycrystalline materials having respectively low (Ti) and high elastic anisotropy of crystallites (Ni alloy) was considered. It was found that the free-surface model gives the best agreement between experimental and theoretical lattice strains measured in samples having low and high elastic crystal anisotropy.
