EUV induced ablation and surface modification of poly(vinylidene fluoride) irradiated in vacuum or gaseous environment
PBN-AR
Instytucja
Instytut Optoelektroniki (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego)
Informacje podstawowe
Główny język publikacji
en
Czasopismo
PROCEEDINGS OF SPIE
ISSN
0277-786X
EISSN
Wydawca
DOI
URL
Rok publikacji
2013
Numer zeszytu
Strony od-do
877708
Numer tomu
8777
Identyfikator DOI
Liczba arkuszy
Słowa kluczowe
en
Extreme ultraviolets
Gaseous environments
Laser plasma
Plasma radiation
Poly (vinylidene fluoride)(PVDF)
Poly(vinylidene fluoride)
Radiation treatments
Significant differences
Ablation
Chemical modification
Ionization
Ionizing radiation
Irradiation
Laser produced plasmas
Mass spectrometry
Nitrogen
Photoelectrons
Plasma interactions
Structure (composition)
Surfaces
X ray optics
X ray photoelectron spectroscopy
Polymers
Konferencja
Indeksowana w Scopus
nie
Indeksowana w Web of Science Core Collection
tak
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Nazwa konferencji (skrócona)
Nazwa konferencji
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Początek konferencji
2013-04-15
Koniec konferencji
2013-04-18
Lokalizacja konferencji
Prague
Kraj konferencji
CZ
Lista innych baz czasopism i abstraktów w których była indeksowana
Streszczenia
Język
en
Treść
Extreme ultraviolet (EUV) is an ionizing radiation strongly absorbed in any kind of mater. In case of polymers absorption depth is of the order of 100 nm. Interaction of EUV photons with polymer chains results in chain scission and formation of low weight fractions. In this work interaction of intense EUV pulses with poly(vinylidene fluoride) (PVDF) was investigated. Mass spectroscopy was employed to investigate the ablation products indicating emission of numerous molecular species of C-containing fragments of the polymer chain. Chemical surface changes after irradiation were investigated using X-ray photoelectron spectroscopy (XPS). The XPS spectra obtained for PVDF, samples irradiated with low and high EUV fluence, indicate significant differences between chemical structures in near-surface layers. It was shown that irradiation with low fluence results in defluorination and thus carbon enrichment in near-surface layer. In contrary, irradiation with high fluence leads to intense material ablation and hardly modifies the chemical structure of the remaining material. Additionally chemical modification of the PVDF surface by EUV irradiation in a presence of ionized nitrogen was investigated. The nitrogen gas, injected into an interaction region, was ionized and excited by the EUV radiation from a laser-plasma source. An ionization degree and excited states of nitrogen were investigated using an EUV spectrometry and the corresponding spectra are presented. Chemical modification of the polymer after combined EUV and ionized nitrogen treatment was investigated using an X-ray photoelectron spectroscopy. Significant contribution of the nitrogen atoms in the polymer near-surface layer after the treatment was demonstrated. © 2013 SPIE.
Cechy publikacji
discipline:Elektronika
discipline:Fizyka
discipline:Electronics
discipline:Physics
Original article
Original article presents the results of original research or experiment.
Oryginalny artykuł naukowy
Oryginalny artykuł naukowy przedstawia rezultaty oryginalnych badań naukowych lub eksperymentu.
Inne
System-identifier
PBN-R:584701
CrossrefMetadata from Crossref logo
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