Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis
PBN-AR
Instytucja
Wydział Chemiczny (Politechnika Gdańska)
Informacje podstawowe
Główny język publikacji
ENG
Czasopismo
Bulletin of the Polish Academy of Sciences-Technical Sciences
ISSN
0239-7528
EISSN
Wydawca
DOI
URL
Rok publikacji
2013
Numer zeszytu
2
Strony od-do
535-539
Numer tomu
61
Identyfikator DOI
Liczba arkuszy
Słowa kluczowe
ATOMIC FORCE MICROSCOPY
HARMONICS
VAN DER WAALS FORCE
Streszczenia
Język
Treść
Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.
Inne
System-identifier
127057